Transient refractive index in a XeF laser

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September 8, 2021 | History

Transient refractive index in a XeF laser

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Transient refractive index was calculated for an e-beam pumped XeF laser having initial concentrations Ne:Xe:NF3::95.5:4.3:0.2. The calculation used Ne in excited states including the transition array 3s yields 4p and all other constituents in ground state. Lines in 3s yields 4p array may be resonant with XeF radiation. To obtain the transient populations for Ne, a modification was made to a Naval Research Laboratory computer code which typically accounts for 180-200 reactions involving 50-60 different species. The modified program included populations in 12 electronic configurations of Ne. Electron beam current was changed 10% at constant voltage to simulate the influence of a hibachi shadow. For a nonresonant laser wavelength, an optical pathlength in the laser, L, less than 35 meters will have distortion delta/lambda less than 0.1; however, for a laser wavelength in resonance with Neon, L of only 0.11 meter will cause delta/lambda = 0.1. The difference in optical pathlength is delta.

Publish Date
Language
English
Pages
38

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Cover of: Transient refractive index in a XeF laser
Transient refractive index in a XeF laser
1980, Naval Postgraduate School
in English

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Edition Notes

"NPS67-80-012"--Cover.

"September 1980"--Cover.

Title from cover.

"Prepared for: Defense Advanced Research Projects Agency, 1400 Wilson Boulevard, Arlington, VA, 22209."

"Includes bibliographical references (p. 33-37).

"Approved for public release; distribution is unlimited"--Cover.

Technical report; 1980.

Published in
Monterey, California

The Physical Object

Pagination
v, 38 p.
Number of pages
38

ID Numbers

Open Library
OL33220443M
Internet Archive
transientrefract00fuhs
OCLC/WorldCat
84004337

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Internet Archive item record

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