Recent advances in metrology, characterization, and standards for optical digital data disks

21-22 July 1999, Denver, Colorado

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Last edited by Tom Morris
January 17, 2023 | History

Recent advances in metrology, characterization, and standards for optical digital data disks

21-22 July 1999, Denver, Colorado

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English
Pages
182

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash., USA
Series
SPIE proceedings series ;, v. 3806, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3806.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.39/767
Library of Congress
TA1635 .R43 1999, TA1635.R43 1999

The Physical Object

Pagination
v, 182 p. :
Number of pages
182

ID Numbers

Open Library
OL6896562M
Internet Archive
recentadvancesin0000unse_g6i1
ISBN 10
081943292X
LCCN
00698331
OCLC/WorldCat
43304860
Goodreads
1926043

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History

Download catalog record: RDF / JSON
January 17, 2023 Edited by Tom Morris merge authors
September 13, 2020 Edited by MARC Bot import existing book
July 31, 2020 Created by ImportBot import existing book