Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.