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Considering measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, this book presents methods of study of the linear and nonlinear optical properties of thin films. It is aimed at specialists in the fields of integrated and thin film optics and for graduates in related specialties.
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1
Waveguide spectroscopy of thin films
2005, Elsevier
electronic resource /
in English
- 1st ed.
0080457894 9780080457895
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Book Details
Edition Notes
Includes bibliographical references (p. 207-217) and index.
Description based on print version record.

