Waveguide spectroscopy of thin films

1st ed.
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September 16, 2021 | History

Waveguide spectroscopy of thin films

1st ed.

Considering measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, this book presents methods of study of the linear and nonlinear optical properties of thin films. It is aimed at specialists in the fields of integrated and thin film optics and for graduates in related specialties.

Publish Date
Publisher
Elsevier
Language
English
Pages
220

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Edition Availability
Cover of: Waveguide spectroscopy of thin films
Waveguide spectroscopy of thin films
2005, Elsevier
electronic resource / in English - 1st ed.

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Book Details


Edition Notes

Includes bibliographical references (p. 207-217) and index.

Description based on print version record.

Published in
Amsterdam
Series
Thin films and nanostructures -- v. 33, Thin films and nanostructures -- v. 33.

Classifications

Dewey Decimal Class
530.4/175
Library of Congress
QC176.83 .K46 2005eb, QC176.83.K46 2005

The Physical Object

Format
[electronic resource] /
Pagination
1 online resource (xv, 220 p.)
Number of pages
220

Edition Identifiers

Open Library
OL27095223M
ISBN 10
0080457894
ISBN 13
9780080457895
OCLC/WorldCat
77210236

Work Identifiers

Work ID
OL19910522W

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