An edition of Advances in scanning probe microscopy
(2000)
Advances in Scanning Probe Microscopy (Advances in Materials Research)
1 edition
by Y. Watanabe
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This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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| Edition | Availability |
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1
Advances in Scanning Probe Microscopy
2012, Springer London, Limited
in English
3642569498 9783642569494
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2
Advances in Scanning Probe Microscopy
2012, Springer Berlin / Heidelberg
in English
3642630847 9783642630842
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3
Advances in Scanning Probe Microscopy (Advances in Materials Research)
April 26, 2000, Springer
Hardcover
in English
- 1 edition
3540667180 9783540667186
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| July 31, 2020 | Edited by ImportBot | import existing book |
| June 28, 2019 | Created by MARC Bot | import existing book |