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Previews available in: English
Subjects
Optical properties, Reflectometer, Materials, Surfaces (Technology), Ellipsometry, Thin films, Reflectance spectroscopy, Phase transformations (statistical physics), Surfaces (technologie), Ellipsométrie, Réflectomètres, Matériaux, Propriétés optiques, Couches minces, Espectrometria, Propriedades óticas, Filmes finos, Materiais, Dünne Schicht, Ellipsometrie, Oberflächeneigenschaft, Reflektometrie, WerkstoffShowing 2 featured editions. View all 2 editions?
Edition | Availability |
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1
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
2008, Wiley & Sons, Incorporated, John
in English
0470349115 9780470349113
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2
Spectroscopic ellipsometry and reflectometry: a user's guide
1999, Wiley
in English
0471181722 9780471181729
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WorldCat
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Book Details
Edition Notes
Includes bibliographical references and index.
"A Wiley-Interscience publication."
Classifications
The Physical Object
ID Numbers
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Feedback?September 14, 2024 | Edited by MARC Bot | import existing book |
October 5, 2021 | Edited by ImportBot | import existing book |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
February 1, 2010 | Edited by WorkBot | add more information to works |
December 9, 2009 | Created by WorkBot | add works page |