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An edition of Machine vision applications in industrial inspection (1993)

Machine vision applications in industrial inspection

3-4 February 1993, San Jose, California

Cover of: Machine vision applications in industrial inspection by Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
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Last edited by MARC Bot
March 11, 2019 | History
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An edition of Machine vision applications in industrial inspection (1993)

Machine vision applications in industrial inspection

3-4 February 1993, San Jose, California

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Publish Date
Publisher
SPIE
Language
English
Pages
272

Subjects

Optical methods Computer vision Quality control Congresses Industrial applications Automation
Edition Availability
Cover of: Machine vision applications in industrial inspection
Machine vision applications in industrial inspection: 3-4 February 1993, San Jose, California
1993, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash., USA
Series
Proceedings / SPIE--the International Society for Optical Engineering ;, v. 1907, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 1907.

Classifications

Library of Congress
TS156.2 .M32 1993, TS156.2.M32 1993

The Physical Object

Pagination
x, 272 p. :
Number of pages
272

Edition Identifiers

Open Library
OL1445358M
ISBN 10
081941140X
LCCN
93083548
OCLC/WorldCat
28211407
Goodreads
4636970

Work Identifiers

Work ID
OL19218330W

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