An edition of In situ real time characterization of thin films
(2000)
In situ real time characterization of thin films
edited by Orlando Auciello, Alan R. Krauss
by Orlando Auciello
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Thin films, Physics| Edition | Availability |
|---|---|
1
In Situ Real-Time Characterization of Thin Films
2008, Wiley & Sons, Incorporated, John
in English
0470304073 9780470304075
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2
In situ real time characterization of thin films: edited by Orlando Auciello, Alan R. Krauss
2001, Wiley
in English
0471241415 9780471241416
|
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3
In Situ Real-Time Characterization of Thin Films
November 20, 2000, Wiley-Interscience
in English
0471241415 9780471241416
|
zzzz
|
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"A Wiley-Interscience publication."
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| October 17, 2022 | Edited by ImportBot | import existing book |
| February 17, 2019 | Created by MARC Bot | import existing book |