This book is currently unavailable on Open Library, check out available alternatives.
An edition of Lock-in thermography (2003)

Lock-in Thermography

Basics and Use for Functional Diagnostics of Electronic Components (Springer Series in Advanced Microelectronics)

1 edition

by and

Cover of: Lock-in Thermography by O. Breitenstein, M. Langenkamp, O. Breitenstein, M. Langenkamp
Lock-in Thermography by O. Breitenstein, M. Langenkamp, O. Breitenstein, M. Langenkamp
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Last edited by MARC Bot
February 13, 2019 | History
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An edition of Lock-in thermography (2003)

Lock-in Thermography

Basics and Use for Functional Diagnostics of Electronic Components (Springer Series in Advanced Microelectronics)

1 edition

by and

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Publish Date
Publisher
Springer
Language
English
Pages
193

Subjects

Thermography Semiconductors Testing Electronic apparatus and appliances Thermal properties
Edition Availability
Cover of: Lock-in Thermography
Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components (Springer Series in Advanced Microelectronics)
August 5, 2003, Springer
Hardcover in English - 1 edition
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Book Details

Classifications

Library of Congress
TK7870.25 .B74 2003

The Physical Object

Format
Hardcover
Number of pages
193
Dimensions
9.3 x 6.2 x 0.6 inches
Weight
1 pounds

Edition Identifiers

Open Library
OL9057690M
ISBN 10
3540434399
ISBN 13
9783540434399
LCCN
2003042481
Goodreads
5949449

Work Identifiers

Work ID
OL18804247W

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