An edition of Three-dimensional imaging, optical metrology, and inspection IV (1998)

Three-dimensional imaging, optical metrology, and inspection IV

2-3 November, 1998, Boston, Massachusetts

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Cover of: Three-dimensional imaging, optical metrology, and inspection IV by Kevin G. Harding
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August 4, 2020 | History
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An edition of Three-dimensional imaging, optical metrology, and inspection IV (1998)

Three-dimensional imaging, optical metrology, and inspection IV

2-3 November, 1998, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
304

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Previews available in: English

Subjects

Triangulation, Mensuration, Congresses, Lasers, Optical measurements, Engineering inspection, Three-dimensional display systems, Measurement, Image processing, digital techniques
Edition Availability
Cover of: Three-dimensional imaging, optical metrology, and inspection IV
Three-dimensional imaging, optical metrology, and inspection IV: 2-3 November, 1998, Boston, Massachusetts
1998, SPIE
in English

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
Proceedings / SPIE--the International Society for Optical Engineering ;, v. 3520, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3520.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TK7882.I6 T47 1998, TK7882.I6T47 1998

The Physical Object

Pagination
ix, 304 p. :
Number of pages
304

Edition Identifiers

Open Library
OL90736M
ISBN 10
0819429813
LCCN
99200346
OCLC/WorldCat
40675684
Goodreads
2665456

Work Identifiers

Work ID
OL18238861W

Source records

Scriblio MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

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August 4, 2020 Edited by ImportBot import existing book
February 9, 2019 Edited by MARC Bot import existing book
February 4, 2019 Created by MARC Bot import existing book