Acoustic Scanning Probe Microscopy Nanoscience and Technology

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Last edited by MARC Bot
August 27, 2024 | History

Acoustic Scanning Probe Microscopy Nanoscience and Technology

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Publish Date
Publisher
Springer
Pages
494

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Cover of: Acoustic Scanning Probe Microscopy
            
                Nanoscience and Technology

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Book Details


Classifications

Library of Congress
QH212.S33 A26 2013, QC1-75, TA1671-1707, TA1501-1820

ID Numbers

Open Library
OL26159853M
ISBN 13
9783642274930
LCCN
2012944383

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Download catalog record: RDF / JSON
August 27, 2024 Edited by MARC Bot import existing book
November 13, 2020 Edited by MARC Bot import existing book
October 14, 2016 Edited by Mek Added new cover
October 14, 2016 Created by Mek Added new book.