An edition of Characterization of high Tc materials and devices by electron microscopy (2000)

Characterization of High Tc Materials and Devices by Electron Microscopy
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy by
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July 28, 2014 | History
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An edition of Characterization of high Tc materials and devices by electron microscopy (2000)

Characterization of High Tc Materials and Devices by Electron Microscopy

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Publish Date
Publisher
Cambridge University Press
Language
English
Pages
406

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Subjects

Electron microscopy Technique High temperature superconductors
Edition Availability
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
July 24, 2000, Cambridge University Press
Hardcover in English

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Book Details

First Sentence

"High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale."

The Physical Object

Format
Hardcover
Number of pages
406
Dimensions
9.7 x 6.9 x 1.3 inches
Weight
2.6 pounds

Edition Identifiers

Open Library
OL7746184M
ISBN 10
052155490X
ISBN 13
9780521554909
Goodreads
1448028

Work Identifiers

Work ID
OL16915732W

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