An edition of Optical metrology and inspection for industrial applications (2010)

Optical metrology and inspection for industrial applications

18-20 October 2010

by , , and

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Optical metrology and inspection for industri ...
Kevin G. Harding, Peisen S. Hu ...
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Last edited by LC Bot
July 25, 2012 | History
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An edition of Optical metrology and inspection for industrial applications (2010)

Optical metrology and inspection for industrial applications

18-20 October 2010

by , , and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English

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Subjects
Engineering inspection, Industrial applications, Optical methods, Quality control, Congresses, Optical measurements, Optical detectors, Interferometry

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Edition Availability
Cover of: Optical metrology and inspection for industrial applications
Optical metrology and inspection for industrial applications: 18-20 October 2010
2010, SPIE
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 7855, Proceedings of SPIE--the International Society for Optical Engineering -- v. 7855.

Classifications

Library of Congress
TS156.2 .O658 2010, QC371 .S67 v. 7855

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL25386613M
ISBN 10
0819483850
ISBN 13
9780819483850
LCCN
2012405680
OCLC/WorldCat
706409780

Source records

Library of Congress MARC record
Library of Congress MARC record

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