Two- and three-dimensional methods for inspection and metrology V

11-12 September 2007, Boston, Massachusetts, USA

Two- and three-dimensional methods for inspec ...
Peisen S. Huang, Peisen S. Hua ...
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Last edited by ImportBot
November 16, 2010 | History

Two- and three-dimensional methods for inspection and metrology V

11-12 September 2007, Boston, Massachusetts, USA

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Publish Date
Publisher
SPIE
Language
English

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Book Details


Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 6762, Proceedings of SPIE--the International Society for Optical Engineering -- v. 6762.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TA1634 .T89 2007, TA1634.T89 2007

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL24430178M
ISBN 10
081946922X
ISBN 13
9780819469229
LCCN
2010459246
OCLC/WorldCat
184985550

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November 16, 2010 Created by ImportBot initial import