An edition of Secondary ion mass spectrometry, SIMS X (1997)

Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

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Secondary ion mass spectrometry, SIMS X
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Last edited by ImportBot
October 17, 2022 | History
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An edition of Secondary ion mass spectrometry, SIMS X (1997)

Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

by

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Publish Date
Publisher
Wiley
Language
English
Pages
1057

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Subjects

Secondary ion mass spectrometry Congresses Ions, spectra Mass spectrometry
Edition Availability
Cover of: Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry: SIMS X
May 1997, John Wiley & Sons Ltd (Import)
Paperback in English
Cover of: Secondary ion mass spectrometry, SIMS X
Secondary ion mass spectrometry, SIMS X: proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995
1997, Wiley
in English

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Book Details

Edition Notes

Published in
Chichester
Other Titles
SIMS X, Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X)

Classifications

Dewey Decimal Class
543.0873
Library of Congress
QD96.S43 I58 1995

The Physical Object

Pagination
xxv, 1057 p. :
Number of pages
1057

Edition Identifiers

Open Library
OL20311974M
ISBN 10
0471958972
OCLC/WorldCat
36720512
Goodreads
4354840

Work Identifiers

Work ID
OL13052079W

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