An edition of Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity
(1997)
Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity
by Jeannette Benavides
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Publish Date
1997
Publisher
National Aeronautics and Space Administration, Goddard Space Flight Center,
National Technical Information Service, distributor]
Language
English
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Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity
1997, National Aeronautics and Space Administration, Goddard Space Flight Center, National Technical Information Service, distributor]
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in English
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Book Details
Edition Notes
Shipping list no.: 99-0723-M.
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1998] 1 microfiche .
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| January 21, 2010 | Edited by WorkBot | add subjects and covers |
| December 11, 2009 | Created by WorkBot | add works page |