An edition of Fault-sensitivity and wear-out analysis of VLSI sensitivity (1994)

Fault-sensitivity and wear-out analysis of VLSI sensitivity

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Fault-sensitivity and wear-out analysis of VL ...
Gwan Seung Choi.
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Last edited by Open Library Bot
December 3, 2010 | History
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An edition of Fault-sensitivity and wear-out analysis of VLSI sensitivity (1994)

Fault-sensitivity and wear-out analysis of VLSI sensitivity

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign, National Aeronautics and Space Administration, National Technical Information Service, distributor
Language
English

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Subjects
Chips (Electronics), Failure analysis, Monte Carlo method, Statistical analysis, Switching circuits, Very large scale integration

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Edition Availability
Cover of: Fault-sensitivity and wear-out analysis of VLSI sensitivity
Fault-sensitivity and wear-out analysis of VLSI sensitivity
1994, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign, National Aeronautics and Space Administration, National Technical Information Service, distributor
Microform in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Fault-sensitivity and wear-out analysis of VLSI sensitivity
Fault-sensitivity and wear-out analysis of VLSI sensitivity
1994, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign, National Aeronautics and Space Administration, National Technical Information Service, distributor
Microform in English
Cover of: Fault-sensitivity and wear-out analysis of VLSI sensitivity
Fault-sensitivity and wear-out analysis of VLSI sensitivity
1994, Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign, National Aeronautics and Space Administration, National Technical Information Service, distributor
Microform in English

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Book Details

Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 95-0062-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 2 microfiches.

Published in
[Urbana, IL], [Washington, DC, Springfield, Va
Series
[NASA contractor report] -- NASA CR-196474., NASA contractor report -- NASA CR-196474.
Other Titles
Fault sensitivity and wear out analysis of VLSI sensitivity.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL17002097M
OCLC/WorldCat
32320458

Source records

Oregon Libraries MARC record

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December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 11, 2009 Created by WorkBot add works page