An edition of Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films (1978)

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films

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Apparatus for simultaneous measurement of mas ...
Alvin Warren Czanderna
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Last edited by WorkBot
January 20, 2010 | History
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An edition of Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films (1978)

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Dept. of Energy, Division of Solar Technology
Language
English
Pages
14

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Subjects
Measurement, Optical properties, Thin films, Specular reflectance, Mass (Physics)

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Edition Availability
Cover of: Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
1978, Dept. of Energy, Division of Solar Technology
in English
  • Not in Library
Cover of: Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
1978, Dept. of Energy, Divison of Solar Technology
in English

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Book Details

Edition Notes

Contract EG-77-C-01-4042

Issued Nov. 1978

Includes bibliographical references

Published in
[Washington]
Series
SERI/TP ; 31-064

The Physical Object

Pagination
iv, 14 p. :
Number of pages
14

ID Numbers

Open Library
OL14883783M

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January 20, 2010 Edited by WorkBot add subjects and covers
December 11, 2009 Created by WorkBot add works page