An edition of Characterisation of different single and multilayer films using phase modulated spectroscopic ellipsometry
(1998)
Characterisation of different single and multilayer films using phase modulated spectroscopic ellipsometry
by N. C. Das
Share
×Close
This work doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
| Edition | Availability |
|---|---|
1
Characterisation of different single and multilayer films using phase modulated spectroscopic ellipsometry
1998, Bhabha Atomic Research Centre
Microform
in English
|
aaaa
|
Book Details
Edition Notes
Microfiche. New Delhi : Library of Congress Office ; Washington, D.C. : Library of Congress Photoduplication Service, 1999. 1 microfiche. Master microform held by: DLC.
Includes bibliographical references (p. 28-29).
At head of title: Government of India, Atomic Energy Commission.
"BARC/1998/E/013".
Classifications
The Physical Object
Edition Identifiers
Work Identifiers
Community Reviews (0)
Lists
| July 20, 2010 | Edited by WorkBot | add subjects from MARC records |
| January 17, 2010 | Edited by WorkBot | add subjects and covers |
| December 9, 2009 | Created by WorkBot | add works page |