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Publish Date
1997
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
10
Subjects
| Edition | Availability |
|---|---|
1
A computer-controlled tensile stage for in-situ X-ray measurements
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
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|
|
2
A computer-controlled tensile stage for in-situ X-ray measurements
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
aaaa
|
|
3
A computer-controlled tensile stage for in-situ X-ray measurements
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
Book Details
Edition Notes
Shipping list no.: 98-0569-M
"December 1997."
Includes bibliographical references (p. 7)
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative
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