An edition of Wafer level reliability of advanced CMOS devices and processes (2008)

Wafer level reliability of advanced CMOS devices and processes

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Wafer level reliability of advanced CMOS devi ...
Yi Zhao, Yi Zhao
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Last edited by ImportBot
August 20, 2020 | History
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An edition of Wafer level reliability of advanced CMOS devices and processes (2008)

Wafer level reliability of advanced CMOS devices and processes

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Publish Date
Publisher
Nova Science Publishers
Language
English

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Subjects

Complementary Metal oxide semiconductors, Metal oxide semiconductors, Complementary, Metal oxide semiconductors, complementary
Edition Availability
Cover of: Wafer level reliability of advanced CMOS devices and processes
Wafer level reliability of advanced CMOS devices and processes
2008, Nova Science Publishers
in English

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Book Details

Edition Notes

Published in
New York

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.99.M44 Z53 2008, TK7871.99.M44Z53

The Physical Object

Pagination
p. cm.

Edition Identifiers

Open Library
OL16820050M
ISBN 13
9781604567137
LCCN
2008018218
OCLC/WorldCat
226308142

Work Identifiers

Work ID
OL10373712W

Source records

Library of Congress MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record

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History

Download catalog record: RDF / JSON
August 20, 2020 Edited by ImportBot import existing book
December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
January 16, 2010 Edited by WorkBot add subjects and covers
December 11, 2009 Created by WorkBot add works page