| Record ID | marc_oregon_summit_records/catalog_files/lewisandclarkbibsrev.mrc:290989381:1747 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/lewisandclarkbibsrev.mrc:290989381:1747?format=raw |
LEADER: 01747nam a2200409 a 4500
001 38470852
003 OCoLC
005 19980226091944.0
007 heubmb024bbca
008 980219s1997 mdua bb f000 0 eng d
035 $a.b12900874$bwatzk$c-
035 $a97084938
037 $a003-003-03447-9$bGPO$fpaper copy$c$3.25
040 $dGPO$dDLC$dMvI
074 $a0247 (MF)
086 0 $aC 13.10:260-129
099 $aC 13.10:260-129
100 1 $aPotzick, James E.
245 10 $aAntireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems$h[microform] /$cJames E. Potzick.
246 2 $aAntireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems.
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;$aWashington :$bFor sale by the Supt. of Docs., U.S. G.P.O.,$c1997.
300 $axiii, 23 p. :$bill. ;$c28 cm.
490 1 $aNIST special publication ;$v260-129.
490 1 $aStandard reference materials.
500 $aDistributed to depository libraries in microfiche.
500 $aShipping list no.: 98-0086-M.
504 $aIncludes bibliographical references (p. 17-18)
533 $aMicrofiche.$b[Washington, D.C.] :$cSupt. of Docs., U.S. G.P.O.,$d[1997]$e1 microfiche : negative.
650 0 $aMicroscopes$xCalibration$xStandards.
650 0 $aIntegrated circuits$xMasks$xMeasurement.
650 0 $aChromium$xSpectra$xStandards.
710 2 $aNational Institute of Standards and Technology (U.S.)
902 $a980818
999 $b2$c980520$dm$ea$f-$g0
994 $awatzk
988 $atmp97116108
945 $lwdocf