An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
(2006)
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces (NanoScience and Technology)
1 edition
by G. Kaupp
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
September 15, 2006, Springer
Hardcover
in English
- 1 edition
3540284052 9783540284055
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"Atomic force microscopy (AFM) is also known as scanning force microscopy (SFM)."
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- Created April 30, 2008
- 16 revisions
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| August 16, 2024 | Edited by MARC Bot | import existing book |
| January 13, 2023 | Edited by ImportBot | import existing book |
| December 30, 2022 | Edited by MARC Bot | import existing book |
| November 12, 2022 | Edited by ImportBot | import existing book |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |