An edition of Scanning electron microscopy and x-ray microanalysis
(1992)
Scanning Electron Microscopy and X-ray Microanalysis
3rd ed. 2003. Corr. 2nd printing edition
by Goldstein, Joseph, Dale E. Newbury, David joy, Patrick Echlin, Eric Lifshin, Linda Sawyer, Charles E. Lyman, and Joseph R. Michael
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Subjects
Scanning electron microscopy, X-ray microanalysis, Scanning electron microscopes, X-rays, X-ray microscopes, Materials science, General, Nanotechnology & mems, Trades & technology -> industrial technology -> materials science, Physical & earth sciences -> science -> general, Biological sciences & nutrition -> biology -> life sciences general, Trades & technology -> technology & engineering -> nanotechnology & mems, Scz17000, Scz00000, Sca11007, Scl26000, Scz19000, Scz14000, 4741, 2866, 2883, 2874, 4227, 3460, Suco11644, 4305
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"The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale."
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- Created April 30, 2008
- 10 revisions
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| March 28, 2025 | Edited by ImportBot | Redacting ocaids |
| January 2, 2017 | Edited by Dodecanethiol | Authors |
| July 29, 2014 | Edited by ImportBot | import new book |
| April 6, 2014 | Edited by ImportBot | Added IA ID. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |