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Edition | Availability |
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1
X-Ray Characterization of Materials
2008, Wiley & Sons, Incorporated, John
in English
3527613757 9783527613755
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2
X-Ray Characterization of Materials
2007, Wiley & Sons, Limited, John
in English
3527613749 9783527613748
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Book Details
Table of Contents
X-ray diffraction -- Robert L. Snyder
Application of synchrotron X-radiation to problems in materials science -- Andrea R. Gerson ... [et al.]
X-ray fluorescence analysis -- Ronald Jenkins
Small-angle scattering of x-rays and neutrons -- Claudine E. Williams, Roland P. May, and André Guinier.
Edition Notes
Includes bibliographical references and index.
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- Created April 1, 2008
- 10 revisions
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July 20, 2024 | Edited by MARC Bot | import existing book |
December 5, 2022 | Edited by ImportBot | import existing book |
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April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |