An edition of Machine vision systems for inspection and metrology VII (1998)

Machine vision systems for inspection and metrology VII

4-5 November, 1998, Boston, Massachusetts

by

Machine vision systems for inspection and met ...
Bruce G. Batchelor
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Last edited by MARC Bot
July 18, 2024 | History
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An edition of Machine vision systems for inspection and metrology VII (1998)

Machine vision systems for inspection and metrology VII

4-5 November, 1998, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
386

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Subjects

Computer vision, Congresses, Optical measurements, Engineering inspection, Industrial applications, Automation

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Edition Availability
Cover of: Machine vision systems for inspection and metrology VII
Machine vision systems for inspection and metrology VII: 4-5 November, 1998, Boston, Massachusetts
1998, SPIE
in English
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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE,, v. 3521, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3521.

Classifications

Dewey Decimal Class
670.42/5
Library of Congress
TA1634 .M3355 1998, TA1634.M3355 1998

The Physical Object

Pagination
xi, 386 p. :
Number of pages
386

ID Numbers

Open Library
OL63159M
ISBN 10
0819429821
LCCN
99159849
OCLC/WorldCat
40261494
Goodreads
768851

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 18, 2024 Edited by MARC Bot import existing book
December 1, 2020 Edited by MARC Bot import existing book
October 10, 2020 Edited by ImportBot import existing book
August 4, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record