An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Application to Rough and Natural Surfaces

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Atomic Force Microscopy, Scanning Nearfield O ...
Gerd Kaupp, Gerd Kaupp
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Last edited by ImportBot
February 25, 2022 | History
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An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Application to Rough and Natural Surfaces

by

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Publish Date
Publisher
Springer London, Limited
Language
English

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Subjects

Scanning tunneling microscopy
Edition Availability
Cover of: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
2010, Springer Berlin / Heidelberg
in English
Cover of: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
2006, Springer London, Limited
in English

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Book Details

Classifications

Library of Congress
TK7875

The Physical Object

Pagination
xii, 292

Edition Identifiers

Open Library
OL37083489M
ISBN 13
9783540284727

Work Identifiers

Work ID
OL27314475W

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February 25, 2022 Created by ImportBot Imported from Better World Books record