An edition of Reliability, testing, and characterization of MEMS/MOEMS
(2001)
Reliability, testing, and characterization of MEMS/MOEMS
22-24 October 2001, San Francisco, USA
by Rajeshuni Ramesham
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Reliability, Microelectromechanical systems, Testing, Congresses| Edition | Availability |
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1
Reliability, testing, and characterization of MEMS/MOEMS: 22-24 October 2001, San Francisco, USA
2001, SPIE
in English
0819442860 9780819442864
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Includes bibliographical references and index.
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- Created April 1, 2008
- 6 revisions
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| November 14, 2023 | Edited by MARC Bot | import existing book |
| July 30, 2023 | Edited by ImportBot | import existing book |
| December 5, 2020 | Edited by MARC Bot | import existing book |
| March 11, 2019 | Edited by MARC Bot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |