An edition of Fundamentals of Bias Temperature Instability in MOS Transistors
(2015)
Fundamentals of Bias Temperature Instability in MOS Transistors
Characterization Methods, Process and Materials Impact, DC and AC Modeling
by Souvik Mahapatra
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| Edition | Availability |
|---|---|
1
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
Oct 23, 2016, Springer
paperback
8132234243 9788132234241
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2
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
2015, Springer
in English
8132225082 9788132225089
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3
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
2015, Springer (India) Private Limited
in English
8132225074 9788132225072
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- Created October 5, 2021
- 2 revisions
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| October 19, 2023 | Edited by ImportBot | import existing book |
| October 5, 2021 | Created by ImportBot | Imported from Better World Books record |