An edition of Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI (2012)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI

23-24 January 2012, San Francisco, California, United States

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Reliability, packaging, testing, and characte ...
Sonia Garcia-Blanco, Rajeshuni ...
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Last edited by ImportBot
September 11, 2021 | History
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An edition of Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI (2012)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI

23-24 January 2012, San Francisco, California, United States

by and

  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English

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Subjects

Reliability, Microelectromechanical systems, Testing, Congresses, Microelectronic packaging

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Edition Availability
Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI
Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI: 23-24 January 2012, San Francisco, California, United States
2012, SPIE
in English
  • Not in Library
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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 8250, Proceedings of SPIE--the International Society for Optical Engineering -- v. 8250.

Classifications

Dewey Decimal Class
621.381
Library of Congress
TK7875 .R438 2012, QC371 .S67 v. 8250, TK7875.R438 2012

The Physical Object

Pagination
1 v. (various pagings)

ID Numbers

Open Library
OL30440974M
ISBN 10
0819488933
ISBN 13
9780819488930
LCCN
2012405994
OCLC/WorldCat
799028268

Source records

Library of Congress MARC record
Better World Books record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 11, 2021 Edited by ImportBot import existing book
September 22, 2020 Created by MARC Bot Imported from Library of Congress MARC record