An edition of X-Ray Microscopy II (1988)

X-Ray Microscopy II

Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

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Cover of: X-Ray Microscopy II by David Sayre, David Sayre, Malcolm Howells, Janos Kirz
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Last edited by ImportBot
August 30, 2020 | History
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An edition of X-Ray Microscopy II (1988)

X-Ray Microscopy II

Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

by

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Publish Date
Publisher
Springer
Pages
472

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Subjects

Physics Optics, Optoelectronics, Plasmonics and Optical Devices Microscopy X-rays
Edition Availability
Cover of: X-Ray Microscopy II
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
Mar 12, 2014, Springer
paperback
Cover of: X-Ray Microscopy II
X-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987"
Mar 17, 2013, Springer, Sayre David
paperback
Cover of: X-Ray Microscopy II
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
1988, Springer Berlin Heidelberg, Imprint: Springer
electronic resource : in English

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Book Details

Edition Notes

Source title: X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

The Physical Object

Format
paperback
Number of pages
472

Edition Identifiers

Open Library
OL29758647M
ISBN 10
3662144891
ISBN 13
9783662144893

Work Identifiers

Work ID
OL19911925W

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