An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
(2006)
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces
by Gerd Kaupp
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Scanning tunneling microscopy| Edition | Availability |
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1
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
2010, Springer Berlin / Heidelberg
in English
3642066631 9783642066634
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2
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
2006, Springer London, Limited
in English
3540284729 9783540284727
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| February 25, 2022 | Created by ImportBot | import new book |