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An edition of SOC (System-on-a-Chip) testing for plug and play test automation (2002)

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

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Cover of: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation by Krishnendu Chakrabarty, Krishnendu Chakrabarty
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Last edited by raybb
July 4, 2025 | History
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An edition of SOC (System-on-a-Chip) testing for plug and play test automation (2002)

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

by

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Publish Date
Publisher
Springer US
Language
English
Pages
200

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Subjects

Plug and play (Computer architecture) Digital electronics Testing Systems on a chip Computer architecture Systems engineering Engineering Computer-aided design Computer engineering Integrated circuits Embedded computer systems
Edition Availability
Cover of: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
2002, Springer US
electronic resource / in English
Cover of: SOC (System-on-a-Chip) testing for plug and play test automation
SOC (System-on-a-Chip) testing for plug and play test automation
2002, Kluwer Academic Publishers
in English

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Book Details

Edition Notes

Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.

Published in
Boston, MA
Series
Frontiers in Electronic Testing -- 21, Frontiers in electronic testing -- 21.

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7888.4, TK7888.4TK1-9971TA34, TK7867-7867.5

The Physical Object

Format
[electronic resource] /
Pagination
1 online resource (vii, 200 p.)
Number of pages
200

Edition Identifiers

Open Library
OL27088025M
ISBN 10
1441953078, 1475765274
ISBN 13
9781441953070, 9781475765274
OCLC/WorldCat
851754178

Work Identifiers

Work ID
OL18901519W

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