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This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the.
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Exploring scanning probe microscopy with mathematica
2007, Wiley-VCH
electronic resource /
in English
- 2nd completely rev. and enl. ed.
3527609873 9783527609871
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Edition Notes
Previous ed.: Chichester : John Wiley, 1997.
Includes bibliographical references and index.
Description based on print version record.
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- Created June 30, 2019
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August 21, 2020 | Edited by ImportBot | import existing book |
June 30, 2019 | Created by MARC Bot | Imported from Internet Archive item record |