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Presents the results of research to improve the electromagnetic immunity of considered analog integrated circuits so that they start to fail at relevantly higher conduction levels.--
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Previews available in: English
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Includes bibliographical references and index.
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- Created December 29, 2011
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February 25, 2022 | Edited by ImportBot | import existing book |
February 25, 2022 | Edited by ImportBot | import existing book |
November 13, 2020 | Edited by MARC Bot | import existing book |
June 30, 2019 | Edited by MARC Bot | import existing book |
December 29, 2011 | Created by LC Bot | Imported from Library of Congress MARC record |