An edition of The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling (1999)

The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling

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The effect of interface roughness and oxide f ...
M.-J Pindera
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Last edited by VacuumBot
August 9, 2012 | History
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An edition of The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling (1999)

The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling

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Publish Date
Publisher
National Aeronautics and Space Administration, Glenn Research Center, Available from NASA Center for Aerospace Information, National Technical Information Service [distributor
Language
English

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Subjects

Film thickness, Interfaces, Oxide films, Stress distribution, Surface roughness, Temperature effects, Thickness

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Edition Availability
Cover of: The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling
The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling
1999, National Aeronautics and Space Administration, Glenn Research Center, Available from NASA Center for Aerospace Information, National Technical Information Service [distributor
Microform in English
Cover of: The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling
The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling
1999, National Aeronautics and Space Administration, Glenn Research Center, Available from NASA Center for Aerospace Information, National Technical Information Service [distributor
Microform in English
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Book Details

Edition Notes

Shipping list no.: 2000-0596-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.

Published in
Cleveland, Ohio, Hanover, MD, Springfield, VA
Series
NASA/TM -- 2000-209770., NASA technical memorandum -- 209770.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL17595000M
OCLC/WorldCat
44121817

Source records

Oregon Libraries MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 9, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; Removed author from Edition (author found in Work)
December 15, 2009 Edited by WorkBot link works
April 24, 2009 Edited by ImportBot add OCLC number
September 29, 2008 Created by ImportBot Imported from Oregon Libraries MARC record