An edition of Reliability of MEMS
(2008)
Reliability of MEMS (Advanced Micro and Nanosystems)
by Gary K. Fedder, Jan G. Korvink, and Osamu Tabata
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1
Reliability of MEMS: Testing of Materials and Devices
2013, Wiley & Sons, Incorporated, John
in English
3527675035 9783527675036
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2
Reliability of MEMS: Testing of Materials and Devices
2013, Wiley-VCH Verlag GmbH
in English
3527335013 9783527335015
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3
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4
Reliability of MEMS: Testing of Materials and Devices
2008, Wiley & Sons, Incorporated, John
in English
352762256X 9783527622566
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5
Reliability of MEMS: Testing of Materials and Devices
2008, Wiley & Sons, Limited, John
in English
3527622136 9783527622139
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6
Reliability of MEMS (Advanced Micro and Nanosystems)
February 15, 2008, Wiley-VCH
Hardcover
in English
3527314946 9783527314942
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- Created April 30, 2008
- 9 revisions
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| December 22, 2020 | Edited by MARC Bot | import existing book |
| October 8, 2020 | Edited by ImportBot | import existing book |
| August 1, 2020 | Edited by ImportBot | import existing book |
| February 9, 2019 | Edited by MARC Bot | import existing book |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |