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IEEE Instrumentation and Measurement Technology Conference (17th 2000 Baltimore, Md.)

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Proceedings of the 17th IEEE Instramentation and Measurement Technology Conference (3-volume set)

by IEEE Instrumentation and Measurement Tec..., M.D.) IEEE Instrumentation and Measureme..., and Institute of Electrical and Electronics ... First published in 2000 — 2 editions

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OLID: OL6427514A

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Created November 9, 2008
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November 9, 2008

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Imported from University of Toronto MARC record