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Last edited by ImportBot
November 3, 2008 | History
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American Society for Testing and Materials. Committee E-4 on Metallography

We need a photo of American Society for Testing and Materials. Committee E-4 on Metallography

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  • Cover of: Symposium on advances in electron metallography and electron probe microanalysis sponsored by subcommittee XI on electron microstructure of ASTM Committee E-4 on electron metallography, held at Atlantic City, N.J., June 28, 1960 and June 26, 1961.

    First published in 1962 1 edition in 1 language
    Not in Library

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  • Cover of: Symposium on electron metallography: presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N. J., June 23, 1959.

    First published in 1960 1 edition in 1 language
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  • Cover of: MiCon 82: optimization of processing, properties, and service performance through microstructure control : a symposium

    First published in 1983 1 edition in 1 language
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  • Cover of: Practical applications of quantitative metallography: a symposium

    First published in 1984 1 edition in 1 language
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We need a photo of American Society for Testing and Materials. Committee E-4 on Metallography

Subjects
Metallography, Congresses, Electron microscopes, Elektronendiffractie, Metalen, Microscopes électroniques, Microstructure, Métallographie, Physical metallurgy

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ID Numbers

  • OLID: OL6321993A

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November 3, 2008 Created by ImportBot Imported from The Laurentian Library MARC record