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Last edited by ImportBot
September 19, 2008 | History

V. Litovchenko

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  • Cover of: Long-term prediction test procedure for most ICs, based on linear response theory: final report

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  • Cover of: Application of linear response theory to experimental data of simultasneous radiation and annealing response of a CMOS device

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  • Cover of: Linear response theory for annealing of radiation damage in semiconductor devices: summary report

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September 19, 2008 Created by ImportBot Imported from Oregon Libraries MARC record