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Last edited anonymously
April 30, 2008 | History
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S. C. Wang

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  • Cover of: Testing, reliability, and applications of optoelectronic devices: 24-26 January, 2001, San Jose, [California] USA

    First published in 2001 — 1 edition
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  • Cover of: Testing, Packaging, Reliability and Applications of Semiconductor Lasers IV (Proceedings of Spie--the International Society for Optical Engineering, V. 3626)

    First published in 1999 — 1 edition
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  • Cover of: Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II: Testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California

    First published in 2000 — 1 edition
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Subjects

Congresses, Reliability, Testing, Semiconductor Diodes, Semiconductor lasers, Diodes, semiconductor, Industrial applications, Lasers in dentistry, Optoelectronic devices, Optoelectronics, Semiconductors

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ID Numbers

  • OLID: OL3213347A

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History

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April 30, 2008 Created by an anonymous user initial import