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Last edited anonymously
April 30, 2008 | History

Ting C. Huang

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  • Cover of: Advances in x-ray analysis.

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  • Cover of: Advances in surface and thin film diffraction: symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

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  • Cover of: Advances in X-Ray Analysis

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  • Cover of: Advances in X-Ray Analysis: Volume 39 (Advances in X-Ray Analysis)

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April 30, 2008 Created by an anonymous user initial import