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Last edited anonymously
April 29, 2008 | History
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Yashwant K. Malaiya

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3 works Add another?

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  • Cover of: 1998 IEEE International Workshop on IDDQ Testing: proceedings : November 12-13, 1998, San Jose, California

    First published in 1998 — 3 editions
    Not in Library

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  • Cover of: 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

    First published in 2000 — 2 editions
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  • Cover of: Bridging faults and IDDQ testing

    First published in 1992 — 1 edition
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We need a photo of Yashwant K. Malaiya

Subjects

Complementary Metal oxide semiconductors, Iddq testing, Testing, Computer Books: General, Computer Engineering, Computers, Congresses, Digital Computer Hardware, Metal oxide semiconductors, Co, Metal oxide semiconductors, Complementary, Circuits & components, Computers - General Information, Data processing, Defects, Electronics - Semiconductors, Electronics engineering, General, Integrated circuits, Internet - Hardware, Logic Design, Metal Oxide Semiconductors (Mos), Systems analysis & design, Systems management, Technology & Industrial Arts

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ID Numbers

  • OLID: OL2853776A

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History

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April 29, 2008 Created by an anonymous user initial import