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Last edited anonymously
April 29, 2008 | History
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N. Keith Tovey

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  • Cover of: Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

    First published in 2005 3 editions in 1 language — 1 previewable
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  • Cover of: Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks

    First published in 1998 1 edition in 1 language — 1 previewable
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We need a photo of N. Keith Tovey

Subjects
Analysis, Electron microscopes, Scanning electron microscopes, Scanning electron microscopy, Sediments (Geology), Rasterelektronenmikroskopie, Sediment, Sedimentary Rocks, Sedimentary rocks, Sediments (geology)

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ID Numbers

  • OLID: OL2759730A

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History

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April 29, 2008 Created by an anonymous user initial import