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Last edited by RenameBot
September 7, 2008 | History

Gerald C. Holst

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19 works Add another?

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  • Cover of: Infrared Imaging Systems: Design, Analysis, Modeling and Testing

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  • Cover of: Electro-Optical Imaging System Performance

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  • Cover of: Testing and evaluation of infrared imaging systems

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  • Cover of: CMOS/CCD sensors and camera systems

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  • Cover of: Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II : 3-5 April, 1991, Orlando, Florida (Spie Proceedings Series, Vol. 1488)

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing VII : 10-11 April 1996, Orlando, Florida

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing IV : 14-15 April 1993, Orlando, Florida

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  • Cover of: Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V : 7-8 April 1994 Orlando, Florida (Proceedings of S P I E)

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing III : 23-24 April 1992, Orlando, Florida

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  • Cover of: CCD arrays, cameras, and displays
    First published in 1996 2 editions in 1 language — 1 previewable

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing VI : 19-20 April 1995, Orlando, Florida

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  • Cover of: Infrared and passive millimeter-wave imaging systems: design, analysis, modeling, and testing : 3-5 April 2002, Orlando, USA

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  • Cover of: Electro-optical imaging system performance (SPIE)

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  • Cover of: Electro-Optical Imaging System Performance (Spie Press Monograph)

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  • Cover of: Common Sense Approach to Thermal Imaging
    First published in 2000 1 edition in 1 language — 1 previewable

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  • Cover of: Common Sense Approach to Thermal Imaging (SPIE Press Monograph Vol. PM86)

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  • Cover of: Sampling, aliasing, and data fidelity for electronic imaging systems, communications, and data acquisition

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing XXI : 6-8 April 2010, Orlando Florida, United States

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  • Cover of: Infrared imaging systems: design, analysis, modeling, and testing XX : 14-16 April 2009, Orlando Florida, United States

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History

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September 7, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import