Untersuchung der elektronenoptischen Eigenschaften von Ablenksystemen für die Anwendung elektronenlithographischer Bildaufzeichnung

Untersuchung der elektronenoptischen Eigensch ...
Gerhard Kilger, Gerhard Kilger
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Last edited by MARC Bot
November 28, 2023 | History

Untersuchung der elektronenoptischen Eigenschaften von Ablenksystemen für die Anwendung elektronenlithographischer Bildaufzeichnung

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Publish Date
Language
German
Pages
87

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Book Details


Edition Notes

Thesis (doctoral)--Eberhard-Karls-Universität zu Tübingen, 1980.

Published in
[s.l.]

The Physical Object

Pagination
87 p.
Number of pages
87

Edition Identifiers

Open Library
OL50019935M
OCLC/WorldCat
65265643

Work Identifiers

Work ID
OL37064520W

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