Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect

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Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect

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Publish Date
Publisher
Springer
Pages
137

Book Details


Edition Notes

Source title: Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect (Springer Theses)

Classifications

Library of Congress
TS1-2301

The Physical Object

Format
hardcover
Number of pages
137

Edition Identifiers

Open Library
OL30111366M
ISBN 10
9811061645
ISBN 13
9789811061646

Work Identifiers

Work ID
OL20919658W

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