An edition of Dielectric Breakdown in Gigascale Electronics (2016)

Dielectric Breakdown in Gigascale Electronics

Time Dependent Failure Mechanisms

by , , and

Cover of: Dielectric Breakdown in Gigascale Electronics by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
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Last edited by ImportBot
August 5, 2020 | History
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An edition of Dielectric Breakdown in Gigascale Electronics (2016)

Dielectric Breakdown in Gigascale Electronics

Time Dependent Failure Mechanisms

by , , and

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Publish Date
Publisher
Springer
Pages
116

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Subjects

Microelectronics, Physical sciences

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Edition Availability
Cover of: Dielectric Breakdown in Gigascale Electronics
Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms
Sep 17, 2016, Springer
paperback
  • Not in Library
Libraries near you: WorldCat
Cover of: Dielectric Breakdown in Gigascale Electronics
Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms
2016, Springer London, Limited
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Source title: Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (SpringerBriefs in Materials)

Classifications

Library of Congress
TA1750-1750.22T174.7

The Physical Object

Format
paperback
Number of pages
116

ID Numbers

Open Library
OL28018988M
ISBN 10
3319432184
ISBN 13
9783319432182

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Better World Books record

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August 5, 2020 Edited by ImportBot import existing book
May 8, 2020 Created by ImportBot import new book