An edition of Advanced Scanning Electron Microscopy and X-Ray Microanalysis
(1986)
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, and Dale E. Newbury
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| Edition | Availability |
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1
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
1986, Springer US
Elektronische Ressource
in German
1475790279 9781475790276
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| February 27, 2022 | Edited by ImportBot | import existing book |
| June 28, 2019 | Created by MARC Bot | import new book |