An edition of Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) (2006)

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by and

Cover of: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) by Adam Foster, Werner A. Hofer, Adam Foster, Werner A. Hofer
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
February 25, 2022 | History
Edit
An edition of Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) (2006)

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Pages
282

Check nearby libraries

Buy this book

Subjects

Scanning probe microscopy

Showing 1 featured edition. View all 1 editions?

Edition Availability
Cover of: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Oct 14, 2006, Springer
  • Not in Library
Libraries near you: WorldCat

Add another edition?

Book Details

Classifications

Library of Congress
TA418.5-.84

ID Numbers

Open Library
OL26771340M
ISBN 10
0387372318
ISBN 13
9780387372310

Source records

amazon.com record
Better World Books record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
February 25, 2022 Edited by ImportBot import existing book
March 10, 2019 Created by ImportBot import new book